Acta Crystallographica Section A


ISSN: 0567-7394        年代:1969
当前卷期:Volume 25  issue 1     [ 查看所有卷期 ]

年代:1969
 
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11. The intensities of multiple diffraction effects
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  94-95

B. Post,  

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12. The correction of measured structure factors for thermal diffuse scattering
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  95-101

W. Cochran,  

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13. Theoretical corrections for extinction
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  102-102

W. H. Zachariasen,  

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14. Introduction to the dynamical theory of X‐ray diffraction
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  103-108

P. P. Ewald,  

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15. The determination of structure factors by means of intensity measurements from large single crystals
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  109-110

B. W. Batterman,   H. Strock,  

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16. Accuracy of intensity measurements from large single crystals
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  111-116

G. Brogren,  

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17. Debye–Waller factor and anomalous absorption (Ge: 293–5°K)
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  116-118

J. Ludewig,  

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18. The determination of structure factors by means of Pendellösung fringes
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  119-128

N. Kato,  

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19. The determination of structure factors from dynamical effects in electron diffraction
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  129-134

J. M. Cowley,  

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20. An accurate absolute scattering factor for silicon
  Acta Crystallographica Section A,   Volume  25,   Issue  1,   1969,   Page  134-138

M. Hart,   A. D. Milne,  

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