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| 1. |
Company profile: Signal Processors Ltd. |
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Journal of the Institution of Electronic and Radio Engineers,
Volume 55,
Issue 9,
1985,
Page 297-298
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PDF (367KB)
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DOI:10.1049/jiere.1985.0097
出版商:IERE
年代:1985
数据来源: IET
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| 2. |
The evolution of the vision system for the EBU DBS standard |
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Journal of the Institution of Electronic and Radio Engineers,
Volume 55,
Issue 9,
1985,
Page 301-305
J.B.Sewter,
D.Wood,
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PDF (715KB)
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摘要:
This paper discusses the factors affecting the choice of time-sequential MAC coding for the EBU vision standard for satellite broadcasting. Consideration is given to both analogue and digital modulation systems and to methods of providing higher display quality.
DOI:10.1049/jiere.1985.0100
出版商:IERE
年代:1985
数据来源: IET
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| 3. |
On-chip testing of embedded p.l.a.s |
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Journal of the Institution of Electronic and Radio Engineers,
Volume 55,
Issue 9,
1985,
Page 306-310
P.Varma,
A.P.Ambler,
K.Baker,
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PDF (682KB)
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摘要:
Rising test generation costs, compounded by the problem of module inaccessibility, have led to a surge of interest in self-testing methods for p.l.a.s. This paper considers the problems associated with the on-chip testing of p.l.a.s deeply embedded in v.l.s.i. systems and presents a method of on-chip testing which uses the input/output registers of the p.l.a. as test aids. An 8-input ×45 product term ×6-output built-in testable p.l.a., which has been implemented in n.m.o.s., is described.
DOI:10.1049/jiere.1985.0101
出版商:IERE
年代:1985
数据来源: IET
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| 4. |
Automatic test scheme for a class of non-linear servosystems using transient response data |
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Journal of the Institution of Electronic and Radio Engineers,
Volume 55,
Issue 9,
1985,
Page 311-316
V.Y.Tawfik,
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PDF (716KB)
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摘要:
The paper discusses the use of digital computers in developing dynamic tests for testing a control system during its actual operation, or for a test rig which simulates the system's working conditions. Usually three levels are required in any successful test scheme: a check-out test to classify the system as faulty or non-faulty, a diagnostic test to locate the parameter or component responsible for the fault and finally an estimation test to establish a quantitative measure for the faulty component before it is repaired or replaced. The scheme is applied in a case study of a throttle control servosystem, where a digital model of the actual system used as a vehicle for the study.
DOI:10.1049/jiere.1985.0102
出版商:IERE
年代:1985
数据来源: IET
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