摘要:

Among the various statistical tools of quality control are the organized sets of sampling inspection plans and tables used in the acceptance sampling activities of producers and consumers. Prominent among these are the LTPD, the AOQL, the AQL and the CSP systems of plans employed in inspections by attributes. This paper outlines how these and some other plans came into being over the past four decades, reviews the growth of concepts during this period, and discusses a number of factors that influenced the development of the sampling inspection plans and tables that are in common use today.

ISSN:0022-4065    

DOI:10.1080/00224065.1969.11981010

出版商:Taylor&Francis    

年代:1969

数据来源: Taylor

摘要:

The second part of this series begins with developments initiated by the second world war. Concepts discussed include acceptable quality level (AQL); classification of defects; normal, tightened and reduced inspection; and single and double sampling plans.

ISSN:0022-4065    

DOI:10.1080/00224065.1969.11981011

出版商:Taylor&Francis    

年代:1969

数据来源: Taylor

摘要:

The third part of this series begins with a discussion of defects-per-unit. Military standard sampling plans for attributes are reviewed in detail. Multiple sampling, limiting quality (LQ), and certain proposed changes in the definition of acceptable quality level (AQL) are examined.

ISSN:0022-4065    

DOI:10.1080/00224065.1969.11981012

出版商:Taylor&Francis    

年代:1969

数据来源: Taylor

摘要:

This last installment discusses several types of continuous sampling plans. A few special-purpose sampling procedures are also briefly noted.

ISSN:0022-4065    

DOI:10.1080/00224065.1969.11981013

出版商:Taylor&Francis    

年代:1969

数据来源: Taylor

ISSN:0022-4065    

DOI:10.1080/00224065.1969.11981008

出版商:Taylor&Francis    

年代:1969

数据来源: Taylor