Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena


ISSN: 0734-211X        年代:1996
当前卷期:Volume 14  issue 1     [ 查看所有卷期 ]

年代:1996
 
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1. Preparation of sharp polycrystalline tungsten tips for scanning tunneling microscopy imaging
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  1-10

R. Zhang,   D. G. Ivey,  

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2. Automated calibration of the sample image using crystalline lattice for scale reference in scanning tunneling microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  11-14

Hideki Kawakatsu,   Hiroshi Kougami,  

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3. Gold oxide as precursor to gold/silica nanocomposites
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  15-21

L. Maya,   M. Paranthaman,   T. Thundat,   M. L. Bauer,  

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4. New and simple method of contact processing characterization using atomic force microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  22-29

D. Mariolle,   D. Lafond,   Y. Morand,  

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5. Scanning tunneling microscopy studies and computer simulations of annealing of gold films
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  30-37

D. Porath,   O. Millo,   J. I. Gersten,  

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6. Domain formation and annealing in an adsorbed liquid crystal monolayer observed by scanning tunneling microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  38-41

F. Stevens,   D. J. Dyer,   D. M. Walba,  

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7. Surface roughness characterization of soft x‐ray multilayer films on the nanometer scale
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  42-47

J. Yu,   J. L. Cao,   Y. Namba,   Y. Y. Ma,  

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8. Systematic investigations of nanostructuring by scanning tunneling microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  48-53

R. Köning,   O. Jusko,   L. Koenders,   A. Schlachetzki,  

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9. Atomic force microscopy study of electron beam written contamination structures
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  54-62

M. Amman,   J. W. Sleight,   D. R. Lombardi,   R. E. Welser,   M. R. Deshpande,   M. A. Reed,   L. J. Guido,  

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10. Multiple‐layer blank structure for phase‐shifting mask fabrication
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  1,   1996,   Page  63-68

Christophe Pierrat,   Theo Siegrist,   John deMarco,   Lloyd Harriott,   Sheila Vaidya,  

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