Instrumentation Science & Technology


ISSN: 1073-9149        年代:1987
当前卷期:Volume 16  issue 1     [ 查看所有卷期 ]

年代:1987
 
     Volume 16  issue 1
     Volume 16  issue 2   
     Volume 16  issue 3   
     Volume 16  issue 4   
1. Time-of-Flight Mass Spectrometry: a Historical Overview
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  1-14

Joseph E. Campana,  

Preview   |   PDF (338KB)

2. Development of Time-Of-Flight Mass Spectrometer Systems
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  15-29

H. Wollnik,  

Preview   |   PDF (504KB)

3. Velocity Compaction - Theory and Performance
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  31-50

M. Luis Muga,  

Preview   |   PDF (531KB)

4. A New Californium-252 Plasma Desorption Time-Of-Flight Mass Spectrometer for High-Mass Studies
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  51-69

R.D. Macfarlane,   J.C. Hill,   D.L. Jacobs,  

Preview   |   PDF (666KB)

5. 252Cf Plasma Desorption Mass Spectrometry: Recent Advances and Applications
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  71-91

I. Kamensky,   A.G. Craig,  

Preview   |   PDF (662KB)

6. Modification of Wiley-Mclaren Tof Analyzers for Laser Desorption
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  93-115

James K. Olthoff,   Ihor Lys,   Plamen Demirev,   Robert J. Cotter,  

Preview   |   PDF (595KB)

7. A System for Pulsed Laser Desorption of Small Biomolecules With Supersonic Jet Injection Using Resonant Two-Photon Ionization (R2Pi) Detection
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  117-131

David M. Lubman,   Roger Tembreull,  

Preview   |   PDF (499KB)

8. A New High-Resolution Tof Mass Spectrometer
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  133-150

Mo Yang,   James P. Reilly,  

Preview   |   PDF (603KB)

9. A High-Resolution Time-of-Flight Mass Spectrometer With Laser Desorption and a Laser Ionization Source
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  151-171

U. Boesl,   J. Grotemeyer,   K. Walter,   E.W. Schlag,  

Preview   |   PDF (517KB)

10. Secondary Ion Time-Of-Flight Mass Spectrometers and Data Systems
  Instrumentation Science & Technology,   Volume  16,   Issue  1,   1987,   Page  173-189

K.G. Standing,   R. Beavis,   G. Bolbach,   W. Ens,   F. Lafortune,   D. Main,   B. Schueler,   X. Tang,   J.B. Westmore,  

Preview   |   PDF (518KB)

首页 上一页 下一页 尾页 第1页 共16条