ISSN:1050-1827    

DOI:10.1002/mmce.4570010102

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractThe development and application of physical models for use in the design of microwave and millimeter‐wave devices and circuits is reviewed. The relative merits of physical models for a variety of active and passive devices are presented together with state‐of‐the‐art results. Particular emphasis is placed on the suitability of the models for use in computer‐aided design software. The techniques used to implement the models in linear and nonlinear designs are examined. Recent developments are presented which indicate the trend toward incorporating these types of models in future design software

ISSN:1050-1827    

DOI:10.1002/mmce.4570010103

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractThe harmonic balance method is a technique for the numerical solution of nonlinear analog circuits operating in a periodic, or quasi‐periodic, steady‐state regime. The method can be used to efficiently derive the continuous‐wave response of numerous nonlinear microwave components including amplifiers, mixers, and oscillators. Its efficiency derives from imposing a predetermined steady‐state form for the circuit response onto the nonlinear equations representing the network, and solving for the set of unknown coefficients in the response equation. Its attractiveness for nonlinear microwave applications results from its speed and ability to simply represent the dispersive, distributed elements that are common at high frequencies. The last decade has seen the development and application of harmonic balance techniques to model analog circuits, particularly microwave circuits. The first part of this paper reviews the fundamental achievements made during this time. The second part covers the extension of the method to quasi‐periodic regimes, optimization analysis, and practical application. A critical assessment of the various types of harmonic balance techniques is given. The different sampling and Fourier transform methods are compared, and numerical speed and precision results are given enabling a quantitative analysis of the merits of the major variants of the harmonic balance technique. Examples of designs which have been modeled using the harmonic balance technique and built both in hybrid and MMIC form are

ISSN:1050-1827    

DOI:10.1002/mmce.4570010104

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractThe undesired effects of electromagnetic coupling between passive elements in MIC and MMIC designs are examined. Measured data of several strongly coupled circuit topologies commonly encountered in MMIC design are compared to simulations using circuit theory programs employing discontinuity models as well as electromagnetic field simulation tools. The results of this comparison are used to derive a set of specifications for a simulation tool suitable for use in the design of MIC and MMIC circuits.

ISSN:1050-1827    

DOI:10.1002/mmce.4570010105

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractA general numerical solver for analyzing microstrip geometries of rectangular shape is presented in this paper. The analytical foundation of this solver is based on an integral equation approach which we formulate in the spatial domain. The unknown surface current on the microstrip is solved by the method of moments using 2D rectangular pulses as the expansion functions. Transmission‐line modeling is then used to parameterize a given microstrip junction or discontinuity. Aided by a graphics interface, this solver can analyze complex structures without incurring additional analytical complexity. We illustrate the accuracy and versatility of our solver by applying it to several different microstrip discontinuities ranging from a single‐stub to an interdigitated capaci

ISSN:1050-1827    

DOI:10.1002/mmce.4570010106

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractStatistical circuit design is essentially a method of design for reliability and high yield. For all but the smallest circuits, this is a CAD problem. Within this problem there are three subproblems: design centering, tolerance assignment, and variability reduction. This paper concentrates on design centering. Yield optimization is inherently a difficult problem because yield cannot, in general, be calculated exactly; only estimates of the yield are available. Furthermore, yield gradients are not available when some yield estimation techniques are used. This paper presents a review of useful definitions using parameter space concepts. Yield estimation techniques and some of their properties are also presented. The two distinct yield optimization strategies commercially available today, statistical and deterministic, are each discussed in detail. Examples of each are given.

ISSN:1050-1827    

DOI:10.1002/mmce.4570010107

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractMicrowave probes are used extensively for linear and nonlinear characterization of microwave devices on wafer and are commercially available for use at frequencies up to 65 GHz. An on‐wafer noise measurement test system, for discrete devices, is now commercially available and on‐wafer power measurement techniques are emerging slowly. These probes are also getting more recognition for the testing of packaged chips, packages, and modules. More accurate calibration techniques and their on‐wafer validation are being developed. Automatic testing of MMIC wafers, using an integrated test system, is a key requirement for the development of low‐cost IC pro

ISSN:1050-1827    

DOI:10.1002/mmce.4570010108

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractThe application of computer‐aided manufacturing (CAM) techniques to the assembly and test of a low‐cost, high‐volume X‐band Radar T/R module will be investigated by highlighting the differences between low frequency and microwave CAM methods, focusing on the difficulties of automated testing, evaluation, and circuit tuning. The problems encountered when implementing high‐precision automated assembly and test methods, which include wire‐bonding, soldering, piece‐part placement, thin wafer GaAs probing, and a novel implementation of a microwave circuit laser‐tuning technique will also be discussed. These CAM techniques, combined with integrated MMIC technology, are then used to illustrate a manufacturing philosophy targeted toward high‐volume microwave

ISSN:1050-1827    

DOI:10.1002/mmce.4570010109

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

ISSN:1050-1827    

DOI:10.1002/mmce.4570010110

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

ISSN:1050-1827    

DOI:10.1002/mmce.4570010101

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY