Journal of Applied Crystallography


ISSN: 1600-5767        年代:1975
当前卷期:Volume 8  issue 1     [ 查看所有卷期 ]

年代:1975
 
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1. Automatic collection of powder data from photographs
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  1-7

E. J. Sonneveld,   J. W. Visser,  

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2. The effects of instrumental distortion in X‐ray diffraction studies of liquids. I. A study of the relative effectiveness of several monochromatizing techniques
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  8-11

S. C. Smelser,   E. H. Henninger,   C. J. Pings,   G. D. Wignall,  

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3. Thickness measurements of wet protein crystals in the electron microscope
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  12-14

D. L. Dorset,   D. F. Parsons,  

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4. Studies of the size and the misorientation of the mosaic blocks in pure and doped single crystals of potassium chloride
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  15-16

G. B. Mitra,   B. K. Samantaray,  

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5. Quantitative interpretation of X‐ray diffraction patterns of mixtures. III. Simultaneous determination of a set of reference intensities
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  17-19

F. H. Chung,  

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6. The neutron Fourier chopper in protein crystallography
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  20-28

A. C. Nunes,  

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7. Misorientation contrast of crystal subgrain boundaries in Berg–Barrett X‐ray micrographs
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  29-36

C. Cm. Wu,   R. W. Armstrong,  

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8. The avoidance of multiple diffraction errors in single‐crystal intensity measurements at low temperatures
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  37-41

R. Hine,   J. P. G. Richards,   K. Tichy,  

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9. Measurement of strain and lattice parameter in epitaxic layers
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  42-44

M. Hart,   K. H. Lloyd,  

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10. A silicon powder diffraction standard reference material
  Journal of Applied Crystallography,   Volume  8,   Issue  1,   1975,   Page  45-48

C. R. Hubbard,   H. E. Swanson,   F. A. Mauer,  

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