Journal of Applied Crystallography


ISSN: 1600-5767        年代:1976
当前卷期:Volume 9  issue 1     [ 查看所有卷期 ]

年代:1976
 
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1. Precision and accuracy of the Bond method as applied to small spherical crystals
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  1-8

C. R. Hubbard,   F. A. Mauer,  

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2. Lattice parameter determination using Kikuchi‐line intersections: application to olivine and feldspar
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  9-13

A. Olsen,  

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3. A low‐temperature apparatus for single‐crystal diffractometry. The unit‐cell dimension of α‐quartz in the temperature range 86–298 K
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  14-17

S. Danielsson,   I. Grenthe,   Å. Oskarsson,  

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4. Changes in microstructure of oriented Ba3Co2Fe24O41material during sintering. II
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  18-27

E. M. C. Huijser‐Gerits,   G. D. Rieck,  

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5. Indexing program for powder patterns especially suitable for triclinic, monoclinic and orthorhombic lattices
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  28-33

F. Kohlbeck,   E. M. Hörl,  

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6. Stereographic X‐ray reflection topography of dislocations in zinc
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  34-38

T. Vreeland,  

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7. X‐ray topographic study of defects in olivine crystals
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  39-41

T. J. Slind,   H. Sørum,  

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8. Absolute sign of piezoelectric and pyroelectric coefficients and spontaneous polarization temperature dependence in α‐Cu(IO3)2, Nd(IO3)3.H2O and LiIO3
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  42-47

R. Liminga,   S. C. Abrahams,  

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9. Etching of bismuth‐antimony crystals in a magnetic field
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  48-50

V. P. Bhatt,   A. R. Vyas,   G. R. Pandya,  

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10. A difference method for precise determination of lattice constants on Weissenberg counter diffractometers
  Journal of Applied Crystallography,   Volume  9,   Issue  1,   1976,   Page  50-51

J. Mad'ar,   B. Pisoňová,   N. Zrubáková,  

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