Journal of Applied Crystallography


ISSN: 1600-5767        年代:1984
当前卷期:Volume 17  issue 1     [ 查看所有卷期 ]

年代:1984
 
     Volume 17  issue 1
     Volume 17  issue 2   
     Volume 17  issue 3   
     Volume 17  issue 4   
     Volume 17  issue 5   
     Volume 17  issue 6   
1. A new method for the measurement of X‐ray diffuse scattering with a combination of an energy‐dispersive detector and source of white radiation
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  1-6

J. Harada,   H. Iwata,   K.‐I. Ohshima,  

Preview   |   PDF (650KB)

2. Measurement of the polarization of X‐rays from a synchrotron source
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  7-12

G. Materlik,   P. Suortti,  

Preview   |   PDF (646KB)

3. Dilatation thermique des phases stables et métastable du naphtalènethiol‐2
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  13-17

N. B. Chanh,   A. Meresse,   Y. Haget,  

Preview   |   PDF (1517KB)

4. Quantitative X‐ray phase analysis of surface layers
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  18-21

L. S. Zevin,   P. Rozenak,   D. Eliezer,  

Preview   |   PDF (388KB)

5. Single‐peak methods for Fourier analysis of peak shapes
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  22-26

R. K. Nandi,   H. K. Kuo,   W. Schlosberg,   G. Wissler,   J. B. Cohen,   B. Crist,  

Preview   |   PDF (503KB)

6. A simple approximation for calculating the small‐angle X‐ray and neutron scattering from polydisperse samples of independently scattering uniform spheres
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  27-32

P. W. Schmidt,   M. Kalliat,  

Preview   |   PDF (454KB)

7. Application of the Energy‐Dispersive X‐ray diffraction method to determine static and dynamic displacements close to D in Ta single crystals
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  33-38

G. Steyrer,   T. H. Metzger,   J. Peisl,  

Preview   |   PDF (656KB)

8. A computer program for unique indexing of electron diffraction patterns
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  39-42

W. Prantl,  

Preview   |   PDF (431KB)

9. MITHRIL–an integrated direct‐methods computer program
  Journal of Applied Crystallography,   Volume  17,   Issue  1,   1984,   Page  42-46

C. J. Gilmore,  

Preview   |   PDF (587KB)

首页 上一页 下一页 尾页 第1页 共9条