ISSN:0748-8017    

DOI:10.1002/qre.4680010102

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

摘要:

AbstractHermeticity testing is a standard part of the process control and procurement procedures for semiconductor components. The various test methods are reviewed and particular emphasis placed on their limitations. It is shown that, although the commonly used tests are incapable of detecting all of the leaks which pose a reliability hazard, these tests can be used to identify batches in which an unacceptably large fraction of the packages are likely to have such leaks.

ISSN:0748-8017    

DOI:10.1002/qre.4680010103

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

摘要:

AbstractThis paper examines the current use of the Arrhenius equation and the activation energies associated with integrated circuits. A short introduction to the Arrhenius equation is given and it is shown how activation energies may be computed from experimental data.The paper next addresses the following basic question: is it reasonable to extrapolate from high‐temperature laboratory life‐tests down to use conditions using the Arrhenius equation? The paper shows that the answer to this question in general must be an emphatic no. It is not the validity of the Arrhenius equation as such that is questioned, but its indiscriminate use by reliability practitioners across the electronics industry.This is not a scientific paper, and no ‘proofs’ are given. The discussion is based on ‘typical’ integrated circuits using published data on the temperature dependence of the hazard rate of such circuits. The paper serves as a warning against thinking that ‘well established practices’ are necessarily scien

ISSN:0748-8017    

DOI:10.1002/qre.4680010104

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

摘要:

AbstractThe development of complex yet highly reliable systems is one of the greatest technical and management challenges of our time. Because such systems are often developed and manufactured for official agencies, and to their specifications, it is necessary to impose controls that will ensure achievement of a performance parameter which is neither predictable nor measurable during development. Since failure is a stochastic process, statistical and actuarial techniques have been developed, but these have been emphasized too much in official reliability programmes.

ISSN:0748-8017    

DOI:10.1002/qre.4680010105

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

摘要:

AbstractA graphical method is given for the analysis of repairable systems failing according to a Weilbull process. The integrated hazard rate is plotted in a logarithmic co‐ordinate system. If the process is of Weibull type the observed data will be located around a straight line. The plot provides estimates of the parameters. The graphical procedure is completed by confidence bands and variation bands built either around the observed failure numbers at fixed time or vice vers

ISSN:0748-8017    

DOI:10.1002/qre.4680010106

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

摘要:

AbstractThis paper presents a demonstration of a methodology for fault removal during software development. The methodology encompasses the entire development history, from system and software requirements generation to system test. Thus it considers not only the faults during software testing after formal configuration controls have been invoked, but also the faults discovered prior to that phase: during system and software requirements generation, preliminary design, detailed design and code and unit testing.The agents for fault discovery used in verification and validation are called activities, techniques and tools (AT&Ts) in this paper, each having a certain maximum potential or capability for fault discovery. The AT&Ts considered include the usual specification review activities, and also certain tools not normally applied in ‘standard’ software development, such as automated requirements aids.Application of the methodology yields numbers of residual faults as of each phase of development, including those remaining to be discovered during operations and maintenance. Some previous experience and data on residual faults correspond to these results, indicating that the methodology and choice of parameters are reasonable.The methodology also allows one to calculate a relative loss due to delay in fault discovery, which, as is well known, rises rapidly when faults are not discovered during the phase in which they are genera

ISSN:0748-8017    

DOI:10.1002/qre.4680010107

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

摘要:

AbstractDespite the recent revolution in statistical thinking and methodology. practical reliability analysis and assessment remains almost exclusively based on a black‐box approach employing parametric statistical techniques and significance tests. Such practice, which is largely automatic for the industrial practitioner, implicity involves a large number of physically unreasonable assumptions that in practice are rarely met. Extensive investigation of reliability source data indicates a variety of differing data structures, which contradict the assumptions implicit in the usual methodology. As well as these, lack of homogeneity in the data, due, for instance, to multiple failure modes or misdefinition of environment, is commonly overlooked by the standard methodology.In this paper we argue the case for exploring reliability data.The pattern revealed by such exploration of a data set provides intrinsic information which helps to reinforce and reinterpret the engineering knowledge about the physical nature of the technological system to which the data refers. Employed in this way, the data analyst and the reliability engineer are partners in an iterative process aimed towards the greater understanding of the system and the process of failure. Despite current standard practice, the authors believe it to be critical that the structure of data analysismustreflect the structure in the failure data. Although standard methodology provides an easy and repeatable analysis, the authors' experience indicates that it is rarely an appropriate one. It is ironic that whereas methods to analyse the data structures commonly found in reliability data have been available for some time, the insistence about the standard black‐box approach has prevented the identification of such ‘abnormal’ features in reliability data and the application of these approaches. We discuss simple graphical procedures to investigate the structure of reliability data, as well as more formal testing procedures which assist in decision‐making methodology. Partial reviews of such methods have appeared previously and a more detailed development of the exploration approach and of the appropriate analysis it implies will be dealt with elsewhere. Here, our aim is to argue the case for the reliability analyst toLOOK AT THE DATA.and to analyse it ac

ISSN:0748-8017    

DOI:10.1002/qre.4680010108

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

摘要:

AbstractUnder high stress conditions the ‘freak’ and ‘strong’ subpopulations lie very close to each other on the time scale. It is easy to ‘read’ such a time‐to‐failure distribution as unimodal, especially when probability paper is used. This paper puts forward Parzen'sestimator of the probability density function as a very useful method of indicating the ‘fre

ISSN:0748-8017    

DOI:10.1002/qre.4680010109

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680010110

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680010111

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1985

数据来源: WILEY