ISSN:0748-8017    

DOI:10.1002/qre.4680060102

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680060103

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680060104

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractThis paper reports the typical problems encountered in the construction and interpretation of control charts for use in the motor industery. The main findings include the fact that the data used to construct the initial control limits sometimes fail to give a true picture of process performance, the statistical theory underlying the design of control charts is often not considered and understood by users, and the taking of samples involving attribute data appears, on occasions, to be more prone to difficulties than is the case with measured data. A list of dos and don'ts is given which may help companies avoid some of the trap encountered in the construction of control charts.

ISSN:0748-8017    

DOI:10.1002/qre.4680060105

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractProduct reliability testing of a video monitor, incorporating rapid thermal cycling, highlighted an interesting problem with failure of a small transformer on the analogue card, causing a severe shimmer of the display. A theoretical model describing this problem is presented, and shows how such an approach can assist in understanding the failure mechanism as well as assisting the resolution of certain dilemmas surrounding it.

ISSN:0748-8017    

DOI:10.1002/qre.4680060106

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractProcess capability indices are key measures in the context of never‐ending improvement in quality. The capability of a process and the effectiveness of control charts are directly related. For samples of size 2 or greater, a Cpk value of 2 ensures that the control chart gives an immediate warning of the potential danger of producing material outside the specification following a shift in the process mean. Capability studies usually result in single point estimates for Cp and Cpk. This ignores sampling variation. More useful estimates can be obtained by constructing confidence intervals for Cp and Cpk. Evaluation of process capbility is relatively easy when a single variable describes the process. However, most processes are multivariate in nature and this makes it difficult to assess the overall capability of the proces

ISSN:0748-8017    

DOI:10.1002/qre.4680060107

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractThis work reports and critically reviews failure mechanisms induced by metal‐GaAs interaction and contact degradation in low and medium power GaAs MESFETs in the framework of a comprehensive reliability evaluation test plan, performed mainly on commercially purchased devices manufactured by different technologies. The results show that, at least as regards contact degradation phenomena, these technologies have reached sufficient maturity, and significant reliability levels have been achieved even for the most severe application and environments. Devices coming from some suppliers still suffer from reliability problems. such as ‘sinking’ of Au‐based gate metallization into the active channel. Al electromigration, Al/GaAs interdiffusion enhanced by high contacts electromigration, surface metal migration and short circuiting of closely spaced electrodes on GaAs with a non‐suitable surface preparation and/or passivation. All these failure mechanisms have been identified by means of suitable microanalytical techniques, correlated with device electrical degradation and thoroughly discussed in this paper by comparison with results previously reported in the technical l

ISSN:0748-8017    

DOI:10.1002/qre.4680060108

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractThe U.S. Department of Defence (DoD) has undertaken the task of modernizing the procedure for qualification of military high‐quality/high‐reliability microcircuits. This new approach, known as generic qualification, will develop a qualified manufacturers list (QML) which will permit certification of design, fabrication, assembly and packaging using an innovative approach. The objective is to have a single process flow on which both commercial and military product will be indistinguishable and only at qualification testing (which is revolutionary) will the differences be evident. The realization of this change is implementation of statistical process control (SPC) methodologies and total quality management (T

ISSN:0748-8017    

DOI:10.1002/qre.4680060109

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractMemory modules used in personal computers were discovered to have a potential reliability defect caused by a fault in the module manufacturing process.In order to assess the eventual impact on personal computer reliability, should it be decided to use these modules, thermal stress testing and subsequent analysis of the results was performed.Several approaches were employed in the calculation of the relevant statistical parameters which would describe the failure pattern; and the validity of each approach was assessed by comparing predicted with actual results. The optimum approach was used in making a projection to normal operating conditions.Finally the analysis was developed to account for the configuration of modules as assembled in the personal computer. This last stage of the analysis allowed the definition of the expected failure pattern of the machine due to defective memory modules.

ISSN:0748-8017    

DOI:10.1002/qre.4680060110

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680060111

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY