1. |
Uncertainty! Uncertainty! |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 1-2
KAM.L. WONG.,
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ISSN:0748-8017
DOI:10.1002/qre.4680030102
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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2. |
Integrated circuits for submarine communication systems, their design and development |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 3-13
A. J. Tew,
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摘要:
AbstractDigital optical systems represent the current advance in submarine communications. Modern system designs require rapid evaluation of new components without relaxation of the stringent reliability requirements demanded for submarine applications. This article describes the development of integrated circuits (ICs) for submarine use. It goes on to show the design methodology, and discusses some limitations and the demanding reliability assurance aspects. The current IC designs are being used in both long‐haul and short‐haul links. The technology discussed is providing a major role in the future development of high‐capacity optical submarine sy
ISSN:0748-8017
DOI:10.1002/qre.4680030103
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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3. |
Using statistical control charts for software quality control |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 15-20
John S. Gardiner,
Douglas C. Montgomery,
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摘要:
AbstractThis paper describes the use of Shewhart U charts for controlling software quality while the software is under development. A parallel between the software development process and a complex manufacturing process is developed. This allows the use of statistical control charts to monitor the software development process.The general approach is to let observed defect data represent a sample of the true but unknown state of the entire software project. Software quality data so obtained can be used to derive a meaningful statistical interpretation of the state of the development project. Based upon this interpretation management can take action to improve the overall software quality while in the development stages.
ISSN:0748-8017
DOI:10.1002/qre.4680030104
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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4. |
Functional screens for electronic reliability |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 21-23
William A. Ganter,
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摘要:
AbstractThis paper describes a class of reliability screens for use in the manufacturing process of electronic products which are directly related to the funcationality of the product being produced. The field reliability that was attained from using functional screening on an example product is presented. Because of the exceptionally low failure occurrence now possible in today's products, some simple alternative reliability monitoring statistics based on the binomial are suggested. Implications of this improved reliability on the effectiveness of screening methods is discussed, and the notion of field failures as screening escapes is introduced. Then some reasons to experiment with functional stress screens in place of a total reliance on the more traditional environmental stress screens are presented. Finally, the characteristics of functional screens are presented. Careful experimentation using appropriate statistical analysis in developing and comparing screening approaches is emphasized throughout this paper.
ISSN:0748-8017
DOI:10.1002/qre.4680030105
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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5. |
(LCCs) R&M Implications of leadless chip carriers |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 25-32
H. E. Fox,
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摘要:
AbstractThe current state‐of‐the‐art regarding LCCs is reviewed in terms of published papers concerning LCC applications, device reliability and attachment techniques. Reliability uncertainties relating to environment, size and attachment geometry are identified. An extensive bibliography is inc
ISSN:0748-8017
DOI:10.1002/qre.4680030106
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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6. |
Research into the use of statistical quality control in british manufacturing industry‐part II |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 33-39
Roy F. Followell,
John S. Oakland,
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摘要:
AbstractThe work described in this paper is part of a large. Government‐funded investigation into the usage of statistical methods of quality control (SQC) in British manufacturing industry. This paper reports the results of work in seventeen companies on the implementation of SQC. The results are summarized by the use of evaluation scales and attributes, and measures of success and barriers are identified. Some general conclusions are drawn which point to a methodology for the introduction of SQ
ISSN:0748-8017
DOI:10.1002/qre.4680030107
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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7. |
Application of a multi‐model approach to estimating residual software faults and time between failures |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 41-51
John B. Bowen,
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摘要:
AbstractThis paper reports the results of applying a multi‐model interactive computer program called SMERFS (statistical modelling and estimation of reliability functions for software) to a large air defence system project. SMERFS includes four fault‐count models and four time‐between‐failure models which were applied at the compilation unit and computer software configuration item level. The four fault‐count models yielded reasonable results supported by acceptable fits for nine of the ten compilation units. The four time‐between‐failure models yielded reasonable results with acceptable fits for all compilation units. A validation of the SMERFS results was attempted by truncating the latter developmental data from the input data, and by using the latter data in lieu of operational data. With the exception of one fault‐count model, no models accurately predicted the simulated o
ISSN:0748-8017
DOI:10.1002/qre.4680030108
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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8. |
A note on the average run length of cumulative sum control charts for count data |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 53-55
John S. Gardiner,
David J. Friedman,
Douglas C. Montgomery,
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摘要:
AbstractThis note presents preliminary results on the average run length (ARL) of a Cumulative Sum Control Chart (CUSUM) used to monitor defects or counts, when the count distribution is Neyman Type‐A. The ARL for this distribution is contrasted to the more customary Poisson model for counts or defects. We show that the ARL curve of a Neyman Type‐A CUSUM always lies below the ARL curve of a Poisson CU
ISSN:0748-8017
DOI:10.1002/qre.4680030109
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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9. |
News Digest |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 57-59
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ISSN:0748-8017
DOI:10.1002/qre.4680030110
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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10. |
International calendar of forthcoming events |
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Quality and Reliability Engineering International,
Volume 3,
Issue 1,
1987,
Page 60-63
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ISSN:0748-8017
DOI:10.1002/qre.4680030111
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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