Quality and Reliability Engineering International


ISSN: 0748-8017        年代:1994
当前卷期:Volume 10  issue 1     [ 查看所有卷期 ]

年代:1994
 
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1. Anniversary!
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  1-1

Finn Jensen,   Pat O'Connor,   Hank Malec,  

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2. Letters to the editor
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  2-2

Örjan Hallberg,  

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3. W. Edwards Deming ‐ a personal memory
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  3-3

David Kerridge,  

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4. Maximum likelihood estimation from record‐breaking data for the weibull distribution
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  5-13

Lori A. Hoinkes,   W. J. Padgett,  

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5. Accelerated ageing within situelectrical testing: A powerful tool for the building‐in approach to quality and reliability in electronics
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  15-26

L. de Schepper,   W. de Ceuninck,   G. Lekens,   L. Stals,   B. Vanhecke,   J. Roggen,   E. Beyne,   L. Tielemans,  

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6. Tolerance design: Choosing optimal tolerance specifications in the design of machined parts
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  27-35

Angus Jeang,  

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7. Simulation strategies to identify the failure parameters of repairable systems under the influence of general repair
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  37-47

C. E. Love,   R. Guo,  

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8. A review of the literature on the use of SPC in batch production
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  49-61

M. Al‐Salti,   A. Statham,  

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9. Operational life testing of power transistors switching unclamped inductive loads
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  63-69

G. L. White,  

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10. A reduced sampling approach for reliability verification
  Quality and Reliability Engineering International,   Volume  10,   Issue  1,   1994,   Page  71-77

Charles R. Allmen,   Ming‐Wei Lu,  

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