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1. |
Anniversary! |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 1-1
Finn Jensen,
Pat O'Connor,
Hank Malec,
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ISSN:0748-8017
DOI:10.1002/qre.4680100102
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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2. |
Letters to the editor |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 2-2
Örjan Hallberg,
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PDF (71KB)
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ISSN:0748-8017
DOI:10.1002/qre.4680100103
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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3. |
W. Edwards Deming ‐ a personal memory |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 3-3
David Kerridge,
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PDF (101KB)
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ISSN:0748-8017
DOI:10.1002/qre.4680100104
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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4. |
Maximum likelihood estimation from record‐breaking data for the weibull distribution |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 5-13
Lori A. Hoinkes,
W. J. Padgett,
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摘要:
AbstractIn destructive stress testing, industrial quality control, or other situations, data may consist only of record setting values, such as successive values that are smaller than all previous ones observed. Here, for a two‐parameter Weibull distribution, the performance of the maximum likelihood estimators (MLEs) from record‐breaking data is studied by computer simulations. Comparison of the biases and mean squared errors of these estimators with those of the MLEs for complete samples from the Weibull distribution is discussed and some examples are presen
ISSN:0748-8017
DOI:10.1002/qre.4680100105
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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5. |
Accelerated ageing within situelectrical testing: A powerful tool for the building‐in approach to quality and reliability in electronics |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 15-26
L. de Schepper,
W. de Ceuninck,
G. Lekens,
L. Stals,
B. Vanhecke,
J. Roggen,
E. Beyne,
L. Tielemans,
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摘要:
AbstractA new technique for reliability and quality optimization of electronic components and assemblies, the so calledin situaccelerated ageing technique with electrical testing, is presented. This technique is extremely useful for the building‐in approach to quality and reliability. First, it can be used to optimize an electronic component or assembly with respect to its quality and reliability performance at a very early stage, i.e. at the design level, at the level of materials selection, and at the level of identifying production techniques and defining production parameters. The typical test time is of the order of 24 hours, which is sufficiently short to allow a design of experiments type approach to quality and reliability optimization. Furthermore, the technique is also very useful for obtaining a deeper understanding of the physico‐chemical processes which lead to failure. A number of practical examples where the technique has been successfully applied are discus
ISSN:0748-8017
DOI:10.1002/qre.4680100106
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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6. |
Tolerance design: Choosing optimal tolerance specifications in the design of machined parts |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 27-35
Angus Jeang,
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摘要:
AbstractThis paper provides a general approach for determining tolerances for machined parts which minimizes the combined machining cost and quality cost. We derive a mathematical model which takes into consideration both machining cost and quality cost, which depend on tolerance specifications and the distribution of the machined part dimension produced by a chosen machining process. The model represents the quality cost with a loss function and represents the machining cost with a fitted curve based on some original data. The distribution of the machined part characteristic is taken to be either normal or triangular, depending on model assumptions. By applying this model, designers can determine the tolerance which provides the minimum expected total cost.
ISSN:0748-8017
DOI:10.1002/qre.4680100107
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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7. |
Simulation strategies to identify the failure parameters of repairable systems under the influence of general repair |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 37-47
C. E. Love,
R. Guo,
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摘要:
AbstractWith repairable systems, it is suspected than many of the post‐failure repairs have the effect of partially resetting the failure rate of the system. Consequently, identifying the correct failure model and its associated parameters is confounded by the impact of these repair effects. The purpose of this paper is to compare the use of several simulation strategies involving mimicking experiments, to assist in this identification process. Data collected from a hydrelectric turbine unit is used to illustrate the approac
ISSN:0748-8017
DOI:10.1002/qre.4680100108
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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8. |
A review of the literature on the use of SPC in batch production |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 49-61
M. Al‐Salti,
A. Statham,
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摘要:
AbstractThe major concern of this paper is to provide a review of the use of SPC techniques in batch production. Data transformation is considered as one of the most important activities when implementing SPC in such an environment. Other activities include focusing attention on the process rather than on the product and the use of standardized control charts (SCCs) in place of traditional charts. Aspects of data transformation are dealt with especially with regard to explaining the mechanism of data transformation and selecting as well as evaluating several transformation techniques. In addition, a method of sensitivity analysis for SCCs is also included.
ISSN:0748-8017
DOI:10.1002/qre.4680100109
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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9. |
Operational life testing of power transistors switching unclamped inductive loads |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 63-69
G. L. White,
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PDF (759KB)
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摘要:
AbstractThis paper describes three types of high voltage power transistors that are in widespread use in the electronics industry today, and their susceptibility to reverse‐biased second breakdown while switching unclamped inductive loads. It provides a brief explanation of the phenomenon of second breakdown in transistors under both forward‐biased and reverse‐biased conditions. It describes a stress circuit that has been developed to incorporate switching of unclamped inductive loads as an integral part of operational life testing. A case history incorporating this technique is presented for the 2SD1739 high voltageNPNbipolar power trans
ISSN:0748-8017
DOI:10.1002/qre.4680100110
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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10. |
A reduced sampling approach for reliability verification |
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Quality and Reliability Engineering International,
Volume 10,
Issue 1,
1994,
Page 71-77
Charles R. Allmen,
Ming‐Wei Lu,
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摘要:
AbstractReliability demonstration tests frequently require large sample sizes which are objectionable from both a cost and time standpoint. The approach presented, referred to as bias sampling, offers a means to demonstrate conformance to reliability objectives with reduced test samples and test time. The reduction is achieved by selection and test of samples from the lower‐median sub‐population of a random sample. The prediction assumes that the entire population of samples was tested. Rationale for the approach is presented along with guidelines for sample selection. Two application examples illustrate how the methodology is being employed at Chrysler Corporat
ISSN:0748-8017
DOI:10.1002/qre.4680100111
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1994
数据来源: WILEY
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