摘要:

The paper describes salient architectural features of the Intel iAPX 432, a recent innovative microprocessor design. It is intended as a companion to a recently published paper (Witten, 1981) which surveys the architectures of the new generation of 16-bit microprocessors, but which was written prior to the announcement of the iAPX 432. The novelty of the new processor lies chiefly in its sophisticated segmentation structure and the design of its instruction set; these are covered in a tutorial fashion and related to earlier developments in computer architecture

ISSN:1744-683X    

DOI:10.1049/sm.1983.0013

出版商:IEE    

年代:1983

数据来源: IET

摘要:

The paper describes a simple interfacing technique with some novel features which at very low cost provides three analogue input channels and an analogue output, permitting a low-cost microcomputer to be used for experiments in on-line control. The technique is applied to a ball-and-plank experiment, one of the simplest systems for which manual control is a real challenge

ISSN:1744-683X    

DOI:10.1049/sm.1983.0014

出版商:IEE    

年代:1983

数据来源: IET

摘要:

It is observed that traditional techniques for high-level programming and assembly-language programming are based on two very different methodologies. The paper presents a methodology for developing assembly-language programs which is more in keeping with established high-level approaches than with lower-level flowchart-based methods. Although the underlying approach is not in itself new, the paper gives a detailed breakdown of the method as a number of distinct clearly defined steps. The program is first designed (in a high-level notation) and then manually translated, by systematically following a set of standard translation rules. A short practical example is given to show how the technique is applied. Finally, some of the benefits of using this approach are reviewed

ISSN:1744-683X    

DOI:10.1049/sm.1983.0015

出版商:IEE    

年代:1983

数据来源: IET

摘要:

The review paper deals with problems concerning fault modelling for LSI/VLSI devices. Both random and regular logic are considered, and different fault classes are discussed for each, including stuck-at, bridging, functional and time-dependent faults. Specific fault models are then considered for microprocessors, RAMs and PLAs

ISSN:1744-683X    

DOI:10.1049/sm.1983.0016

出版商:IEE    

年代:1983

数据来源: IET

ISSN:1744-683X    

DOI:10.1049/sm.1983.0021

出版商:IEE    

年代:1983

数据来源: IET