|
1. |
The inadequacy of the stuck-at fault model for testing mos lsi circuits: a review of mos failure mechanisms and some implications for computer-aided design and test of mos lsi circuits |
|
Soft Matter,
Volume 3,
Issue 2,
1984,
Page 30-36
N.Burgess,
R.I.Damper,
Preview
|
PDF (1737KB)
|
|
摘要:
The stuck-at fault model is widely used as the basis for automatic test pattern generation in digital circuit testing, for example the D-algorithm. However, there have been growing doubts over the ability of the model to cover faults that occur in MOS LSI circuits. The paper consists of a review of the failure mechanisms that produce faults in MOS LSI circuits, a discussion of the problems that arise when using the stuck-at fault model to test MOS LSI circuits and a set of guidelines for the future development of computer-aided design and test of such circuits.
ISSN:1744-683X
DOI:10.1049/sm.1984.0011
出版商:IEE
年代:1984
数据来源: IET
|
2. |
A testability measure to improve algebraic test generation |
|
Soft Matter,
Volume 3,
Issue 2,
1984,
Page 37-41
AntonioLioy,
MarcoMezzalama,
Preview
|
PDF (1367KB)
|
|
摘要:
The paper deals with testability measures of digital systems. Specifically, a new algorithm to evaluate testability measures for circuits described in terms of Boolean equations is presented, and its application to speed up (algebraic) test generation for sequential networks is discussed.
ISSN:1744-683X
DOI:10.1049/sm.1984.0013
出版商:IEE
年代:1984
数据来源: IET
|
3. |
Cmos microprocessor systems |
|
Soft Matter,
Volume 3,
Issue 2,
1984,
Page 42-44
N.Bankay,
Preview
|
PDF (594KB)
|
|
摘要:
The paper reviews the availability of CMOS components for use in low-power microprocessor systems. The advantages/disadvantages of such systems over those in use at present are also discussed.
ISSN:1744-683X
DOI:10.1049/sm.1984.0014
出版商:IEE
年代:1984
数据来源: IET
|
4. |
Microprocessors in an automotive application |
|
Soft Matter,
Volume 3,
Issue 2,
1984,
Page 45-51
R.Green,
S.Ismail,
Preview
|
PDF (829KB)
|
|
摘要:
Recent developments in microelectronic technology, particularly the microprocessor, have resulted in interesting developments for automatic control of transport machines, such as locomotives and aircraft. The paper considers the convenience of this technology in a ‘domestic’ application: the control, indirectly, of the distance between vehicles in foggy weather and dark, obscured conditions. An easily available Doppler radar module and ultrasonic transducers are used jointly as remote sensors.
ISSN:1744-683X
DOI:10.1049/sm.1984.0015
出版商:IEE
年代:1984
数据来源: IET
|
|