Microscopy Research and Technique


ISSN: 1059-910X        年代:1992
当前卷期:Volume 20  issue 1     [ 查看所有卷期 ]

年代:1992
 
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1. Editorial
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  1-1

John E. Johnson,  

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2. New initiatives in quantitative morphology
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  2-2

Robert Bolender,  

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3. The blood‐testis barrier and sertoli cell junctions: Structural considerations
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  3-33

R.‐Marc Pelletier,   Stephen W. Byers,  

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4. Nickel nitrate: A new junction permeability tracer for the study of the blood‐testis barrier
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  34-42

Juan C. Cavicchia,   Fabio L. Sacerdote,   Luis A. Gutierrez,  

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5. Effects of vitamin A deficiency on the inter—Sertoli cell tight junctions and on the germ cell population
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  43-49

Nermine Ismail,   Carlos R. Morales,  

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6. Intermediate filaments in sertoli cells
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  50-72

G. Aumüller,   C. Schulze,   C. Viebahn,  

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7. A personal computer based implementation of the maximum‐likelihood method of analysis of electron microscope autoradiographs
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  73-86

Badrinath Roysam,   David R. Maffitt,   Michael I. Miller,   Jeffrey E. Saffitz,   Lewis J. Thomas,  

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8. Comparison of Alcian blue and ruthenium red effects on preservation of outer envelope ultrastructure in methanotrophic bacteria
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  87-94

Theresa A. Fassel,   Marilyn J. Schaller,   Charles C. Remsen,  

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9. A temperature‐jump device for time‐resolved cryo‐transmission electron microscopy
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  95-101

M. H. Chestnut,   D. P. Siegel,   J. L. Burns,   Y. Talmon,  

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10. Fundamental electron and ion beam interactions with solids for microscopy, microanalysis and microlithography. Scanning microscopy supplement 4, edited by Jergen Schou, Pieter Kruit, and Dale Newbury. Scanning Microscopy International, AMF O'Hare, Chicago, Illinois, 1990, 379 pp, $59.00 (USA), $64.00 (elsewhere)
  Microscopy Research and Technique,   Volume  20,   Issue  1,   1992,   Page  102-102

P. E. Batson,  

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