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1. |
From the editor |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 1-1
John Gilfrich,
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ISSN:0049-8246
DOI:10.1002/xrs.1300200102
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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2. |
Guest editorial |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 3-3
Yohichi Gohshi,
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PDF (80KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300200103
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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3. |
Trends in quantification in XRF |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 5-7
B. A. R. Vrebos,
G. T. J. Kuipéres,
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PDF (293KB)
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摘要:
AbstractTrends in the areas of analysis of low atomic number elements, routine quantitative analysis, matrix correction methods, qualitative analysis, set up and calibration, data processing and lower limits of detection are given, based on a short overview of the past, and extrapolating to the future.
ISSN:0049-8246
DOI:10.1002/xrs.1300200104
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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4. |
Intensity and distribution of background x‐rays in wavelength‐dispersive spectrometry |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 9-22
Tomoya Arai,
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PDF (984KB)
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摘要:
AbstractExtensive studies of the components and distribution which govern background x‐ray intensity in the short wavelength region of wavelength‐dispersive spectrometry have been made. The theoretical calculations account for the contribution of coherent scattering (including anomalous dispersion factors), Compton scattering and absorption effects. For the precise comparison between the calculated and experimentally measured intensities, coherent and Compton scattered intensities of Rh Kα and Rh Kβ emitted from a rhodium‐target x‐ray tube were investigated with respect to different kinds of specimens. From the differences in the calculated and measured intensities, the intensity tailing of the large peak of the major components was found to be the Compton scattering of fluorescent x‐rays. A theoretical expression for calculating the magnitude of the background x‐ray intensity using an appropriately selected standard sample is described. The application of Co Kα x‐rays interferred by Fe Kβ x‐rays and the small intensity change in background x‐rays for the trace element analysis of steel
ISSN:0049-8246
DOI:10.1002/xrs.1300200105
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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5. |
Instrumental developments in total reflection x‐ray fluorescence analysis for K‐lines from oxygen to the rare earth elements |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 23-28
P. Wobrauschek,
P. Kregsamer,
C. Streli,
H. Aiginger,
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PDF (445KB)
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摘要:
AbstractDevelopments in the instrumentation of total reflection x‐ray fluorescence analysis (TXRF) are presented. Different ways of obtaining optimized primary radiation are discussed, and a new double reflector‐collimator is introduced. To increase the number of detectable elements, special devices for low‐Zand high‐Zdeterminations are presented, in addition to a modular TXRF attachment for versatile applications. Detection limits achieved by various types of excitation conditions are given. TXRF has been shown to be a powerful analytical tool for trace element determinations in various
ISSN:0049-8246
DOI:10.1002/xrs.1300200106
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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6. |
Thin‐film characterization by x‐ray fluorescence |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 29-33
T. C. Huang,
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PDF (432KB)
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摘要:
AbstractA precise and practical x‐ray fluorescence technique using the fundamental‐parameter method and the LAMA computer program for the simultaneous determination of composition and thickness of single‐ and multiple‐layer thin films is reviewed. Results from the analysis of Fe–Ni single‐layer and chromium, Fe–Ni, copper triple‐layer thin films are discussed. The analysis showed that x‐ray absorption and enhancement caused by the inter‐element effect in single‐layer and the inter‐layer effect in multiple‐layer films were corrected properly. The accuracy of the analysis is estimated to be ±1% for composi
ISSN:0049-8246
DOI:10.1002/xrs.1300200107
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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7. |
Compact synchrotron radiation light source covering the soft x‐ray to the ultraviolet spectral region |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 35-37
Hiromitsu Nakabushi,
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摘要:
AbstractThe compact superconducting synchrotron radiation source AURORA is being developed for industrial use, especially for x‐ray lighography. This source can also be used for research purposes. A prototype machine has been constructed to demonstrate the performance and to study various applications. Acceleration and storage of electrons in the ring was recently achieved. A storage current of 20 mA at 650 MeV energy is attained and the beam lifetime is more than 20 h. The half‐integral resonance injection method has been proved to work well. Further improvements are being studied, including that of the performance of the injec
ISSN:0049-8246
DOI:10.1002/xrs.1300200108
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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8. |
News |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 39-39
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PDF (232KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300200110
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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9. |
Forthcoming meetings and conferences |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page 41-41
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PDF (68KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300200111
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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10. |
Masthead |
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X‐Ray Spectrometry,
Volume 20,
Issue 1,
1991,
Page -
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PDF (91KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300200101
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
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