X‐Ray Spectrometry


ISSN: 0049-8246        年代:1975
当前卷期:Volume 4  issue 1     [ 查看所有卷期 ]

年代:1975
 
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     Volume 4  issue 4   
1. Editorial
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  1-1

Ron Jenkins,  

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2. Experiences with automated X‐ray fluorescence spectrometry in the analysis of refractory metals
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  2-10

H. M. Ortner,   E. Lassner,   P. Hertroys,  

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3. Determination of a binary calibration curve with one or two standard specimens in X‐ray flourescence analysis
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  11-13

H. Kähkönen,   P. Suhonen,  

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4. Forthcoming Conferences&Meetings
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  13-13

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5. The shape of the continuous X‐ray spectrum and background corrections for energy‐dispersive electron microprobe analysis
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  14-17

S. J. B. Reed,  

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6. News and events
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  15-18

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7. A mathematical model for tertiary X‐rays from heterogeneous samples
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  18-25

William L. Dunn,   Carl R. Efird,   Robin P. Gardner,   Kuruvilla Verghese,  

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8. Decomposition of the aluminium Kα1, 2doublet
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  26-27

E. Källne,   T. Åberg,  

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9. Analysis of powdered materials by X‐ray fluorescence spectrometry. Evaluation and correction of the interferences
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  28-32

P. Frigieri,   R. Trucco,   E. Caretta,  

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10. Incidence, detection and monitoring of radiation from X‐ray analytical instrumentation
  X‐Ray Spectrometry,   Volume  4,   Issue  1,   1975,   Page  33-42

R. Jenkins,   D. J. Haas,  

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