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1. |
Editorial |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 1-1
Ron Jenkins,
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ISSN:0049-8246
DOI:10.1002/xrs.1300040102
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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2. |
Experiences with automated X‐ray fluorescence spectrometry in the analysis of refractory metals |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 2-10
H. M. Ortner,
E. Lassner,
P. Hertroys,
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摘要:
AbstractThis paper reflects three years' experience on the part of two of the authors with the Philips PW 1220/C X‐ray fluorescence spectrometer in combination with the Philips software packages ‘X‐ray 21’ and ‘X‐ray 10’ for the analysis of molybdenum, tungsten and their alloys.Of the ten analysis programs developed, three are discussed in detail. They embrace the determination of main constituents in the region of 100 per cent as well as the determination of traces in the ppm range after trace‐matrix separation. For trace analysis the standard software had to be modified in order to measure several blanks and standards and to overcome other shortcomings in the original program. The arithmetical means of blanks and standards are used for the calculation of linear calibration functions. This new, more versatile X‐ray 10 software package extends the applicability of the standard X‐ray 10 system to trace analysis. It also proved advantageous for the analysis of minor constituents i
ISSN:0049-8246
DOI:10.1002/xrs.1300040103
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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3. |
Determination of a binary calibration curve with one or two standard specimens in X‐ray flourescence analysis |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 11-13
H. Kähkönen,
P. Suhonen,
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PDF (184KB)
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摘要:
AbstractTwo simple approximate formulae have been derived for binary calibration curves. These formulae contain one or two constants, which can be determined experimentally with one or two standard specimens, respectively. These formulae can be applied within a wide range around the composition of the standard specimen. These approximations can be used both in X‐ray and in isotope excited fluorescence analysi
ISSN:0049-8246
DOI:10.1002/xrs.1300040104
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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4. |
Forthcoming Conferences&Meetings |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 13-13
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PDF (46KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300040111
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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5. |
The shape of the continuous X‐ray spectrum and background corrections for energy‐dispersive electron microprobe analysis |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 14-17
S. J. B. Reed,
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PDF (293KB)
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摘要:
AbstractThe shape of the continuous spectrum between 0.5 and 10 keV generated by 10 to 25 keV electrons has been calculated. It is shown that Kramers' law underestimates the intensity generated at low X‐ray energies. However, this is partially compensated by the greater absorption suffered by continuum X‐rays compared with characteristic X‐rays, which is demonstrated by comparing the depth distributions derived from Monte‐Carlo calculations. Refinement of the background correction in energy‐dispersive microprobe analysis in the light of these results is desirable, though for most purposes the method based on Kramers' law corrected for absorption by the conventional means used for characteristic radiation is
ISSN:0049-8246
DOI:10.1002/xrs.1300040105
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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6. |
News and events |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 15-18
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PDF (668KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300040112
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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7. |
A mathematical model for tertiary X‐rays from heterogeneous samples |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 18-25
William L. Dunn,
Carl R. Efird,
Robin P. Gardner,
Kuruvilla Verghese,
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摘要:
AbstractA mathematical model is derived for tertiary X‐ray fluorescence from heterogeneous samples based on generally accepted primary X‐ray fluorescence models. Variable source‐sample‐detector geometry, sample particle size and packing fraction effects are included. The model is expressed explicitly for three different ways of treating the attenuation within the sample. Calculations of the model are made for comparison with primary and secondary fluorescence calculations, and for comparison with calculated and experimantal results reported in the literature which include tertiary
ISSN:0049-8246
DOI:10.1002/xrs.1300040106
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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8. |
Decomposition of the aluminium Kα1, 2doublet |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 26-27
E. Källne,
T. Åberg,
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PDF (174KB)
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摘要:
AbstractIt is shown that a unique resolution of the aluminium Kα1, 2line into Lorentzian components is impossible unless some physical parameters characterizing the components are specified
ISSN:0049-8246
DOI:10.1002/xrs.1300040107
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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9. |
Analysis of powdered materials by X‐ray fluorescence spectrometry. Evaluation and correction of the interferences |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 28-32
P. Frigieri,
R. Trucco,
E. Caretta,
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PDF (391KB)
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摘要:
AbstractA method is described for the direct quantitative analysis by X‐ray fluorescence spectrometry of some elements in powdered materials collected on inert filters. In order to gain a view of the general applicability of the method, the effects of the interferences due to the nature of the analytical samples were studied and verified, and a possible means of overcoming them is proposed. The principal factors that effect the interference phenomena were found to be variation of the X‐ray path into the sample due to different deposit thickness, different X‐ray beam penetration owing to sample density, and absorption and enhancement of the characteristic radiation by the combining elements. The aim of this work is to propose a method which eliminates the drawbacks due to the matrix absorption effects, whatever their origin. A better understanding of the phenomena, the mathematical treatment of the basic principles and the use of experimental artifices, allowed us to achieve optimized conditions for analysis, suitable for general routine applica
ISSN:0049-8246
DOI:10.1002/xrs.1300040108
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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10. |
Incidence, detection and monitoring of radiation from X‐ray analytical instrumentation |
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X‐Ray Spectrometry,
Volume 4,
Issue 1,
1975,
Page 33-42
R. Jenkins,
D. J. Haas,
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PDF (1277KB)
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摘要:
AbstractThe incidence of actual and potential radiation accidents is discussed along with the biological effects which have been observed as a result of known incidents. Recommendations are put forward whereby a given operator can reduce the possibility of accidental exposure. A description of active and passive monitoring devices is also given along with a set of guidelines for their selection and use.
ISSN:0049-8246
DOI:10.1002/xrs.1300040109
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1975
数据来源: WILEY
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