X‐Ray Spectrometry


ISSN: 0049-8246        年代:1985
当前卷期:Volume 14  issue 1     [ 查看所有卷期 ]

年代:1985
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  1-1

Ron Jenkins,  

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2. Intensity for cubic particles in x‐ray fluorescence analysis
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  2-7

R. D. Bonetto,   J. A. Riveros,  

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3. Quantitative light element analysis using an energy‐dispersive detector: 2—continuum removal and peak deconvolution
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  8-15

D. J. Bloomfield,   G. Love,  

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4. Quantitative x‐ray diffraction analysis on thin samples deposited on cellulose membrane filters
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  16-19

S. Battaglia,  

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5. Identification of unconverted oxide phases in a synthetic clay mineral by scanning electron microscopy and the x‐ray microprobe
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  20-22

Mahendra Patel,  

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6. K and L x‐ray emission intensities of some radionuclides
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  23-26

H. R. Verma,   Dharminder Pal,  

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7. Inverse formulations of the Sherman equation for x‐ray spectrometry: A review of existing algorithms
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  27-35

B. Vrebos,   J. A. Helsen,  

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8. Quantitative electron probe microanalysis in the system Fe–Sn–C using the Claisse–Quintin relation
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  36-42

W. Fredriksz,   H. Koster,   B. H. Kolster,  

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9. Fluorescence yields, ωK(12 ≤Z≤ 42) and ω L 3(38 ≤Z≤ 79), from a comparison of literature and experiments (SEM)
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  43-47

Wolfgang Hanke,   Johann Wernisch,   Christian Pöhn,  

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10. Forthcoming meetings&conferences
  X‐Ray Spectrometry,   Volume  14,   Issue  1,   1985,   Page  48-48

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