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1. |
Conference reports |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 1-2
P. W. Hurley,
John F. Croke,
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PDF (213KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300030111
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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2. |
A critical survey of mixing, dilution and addition methods and addition methods and possible extensions of the theory. Part I |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 2-14
R. Gwozdz,
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PDF (962KB)
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摘要:
AbstractThe commonly used equation relating the intensity of characteristic X‐radiation to the concentration of the element to be determined contains three unknowns. By chanfing the concentration of this element in two additionally prepared samples further data are obained permitting the derivation of two more equations. Solution of these three equations by algebraic or graphical methods yields the concentration of the elemen. Formulae have been derived desribing ten experimental variants of this principle. Three of these formulae are similar to those described by sherman and Tertian. The other two describe the semi‐emipirical methods of addition, and mixing‐dilution developed by Jones.The experimental data for eleven elements involving ten kα lines, two Kβ lines and one Lα line were obtained using two X‐ray units. The samples were investigated in the form cf liquid, powder pellet, glass disc and powdered glass disc. Only the three most general formulae have used in the calculations. Results show absolute percentage deviations with
ISSN:0049-8246
DOI:10.1002/xrs.1300030103
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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3. |
All you ever wanted to know about X‐ray energy spectrometry. Rolf Woldseth. KeVeX Corporation, 1973. $ 7.95 |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 3-4
Dale Gedcke,
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PDF (164KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300030114
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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4. |
Erratum |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 4-4
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PDF (54KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300030115
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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5. |
News and events |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 5-10
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PDF (1565KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300030116
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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6. |
The on‐stream analysis of hematite ore fractions using radioisotopes |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 15-20
D. J. Reed,
J. L. Dalton,
A. H. Gillieson,
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PDF (621KB)
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摘要:
AbstractHematite ore fractions in the form of circulating slurries of various solids content were analyzed for iron and silicon, their principal metallic constituents, to determine the relationships and factors significant to such analyses. Radioisotopes were used to excite the characteristic radiations which were measured nondispersively. Counts were also taken for the exciting radiations.The measured intensities for Fe Kα and Si Kα were corrected by backscatter and absorption factors derived by the comparison of counts from the slurries to those from water. Regression lines were used to convert all counts to a 40% solid basis.The iron content of the ore fractions was determined with a standard error of less than 2%. The determination of silicon was not satisfactory at low concentrations because all components of the slurries absorb Si Kα strong
ISSN:0049-8246
DOI:10.1002/xrs.1300030104
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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7. |
Dilution method in quantitative X‐ray diffraction analysis |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 21-25
N. H. Clark,
R. J. Preston,
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PDF (347KB)
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摘要:
AbstractThe theory of the single dilution and double dilution methods for quantitative X‐ray diffraction analysis is presented, and verified experimentally for the analysis of silica in a set of seven synthetic standards. Dilution methods are a new concept in diffraction analysis, and show advantages over other method
ISSN:0049-8246
DOI:10.1002/xrs.1300030105
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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8. |
Ein Beitrag zur quantitativen Elektronen‐strahlmikroanalyse von Phasen in polierten Anschliffen von Silikatproben mit dem Raster‐Elektronemikroskop und energie‐dispersiver Messung der Röntgenstrahlung |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 26-30
M. P. Brandit,
F. Blum,
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PDF (684KB)
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摘要:
AbstractIn diesem Artikel wird als Beitrag zur Elektronenstrahlmikroanalyse eine quantitaive röntgenographische Analyse von Phasen in polierten Anschliffen von Silikatproben beschrieben. Für die energiedispersive Messung der Röntgenstrahlung ist das Raster Elektronenmikrosk op mit einem Halbleitermessplatz und für Die Bilderzeugung mit einem Halbeitermessplatz und fü die Genauigkeit der Anlage und die damit erreichbare Nachweisgrenze werden bestimmt. Die Berechung der Konzentration wied nach einer von Salter vorgeschlagenen vorschrift mit Hilfe von binären Oxidsystemen und renien Oxiden als Standardproben berechnet. Als analytisches Bisipiel für die Elektronenstrahlmikroanalyse wurde ein Zementklinker g
ISSN:0049-8246
DOI:10.1002/xrs.1300030106
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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9. |
Theoritical alpha coefficients for the Claisse‐Quintin relation for X‐ray spectrochemical analysis |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 31-36
R. Rousseau,
F. Claisse,
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PDF (449KB)
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摘要:
AbstractMathematical equation are given for calculating the theoritical values of α coefficients in the Claisse‐Quintin relation for any combination of elements and experimental conditions. The Claisse‐Quintin relation becomes an approximation of the Sherman equation with minor deviations.The method can be extended to electron microprobe anal
ISSN:0049-8246
DOI:10.1002/xrs.1300030107
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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10. |
Quantitative analysis using the absorption of white X‐ray radiation |
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X‐Ray Spectrometry,
Volume 3,
Issue 1,
1974,
Page 37-39
H. Kähkönen,
P. Suhonen,
M. Yli‐Penttilä,
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PDF (194KB)
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摘要:
AbstractThe absorption of continuous radiation was used in X‐ray absorption analysis. The entire spectrum was measured simultaneously by using a solid state detector and a multi‐channel pulse height analyser. The analysis of the spectra was performed via a method, where only the energy spectrum but not the intensity of the primary beam need be kn
ISSN:0049-8246
DOI:10.1002/xrs.1300030108
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1974
数据来源: WILEY
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