ISSN:0049-8246    

DOI:10.1002/xrs.1300020110

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

摘要:

AbstractUne méthode est donnée pour l'interprétation des spectres‐X des composés par la théorie des orbitales moléculaires; enparticulaire, l'emission Kβ1,3des composés du silicium. On sait, grace de la spectroscopie photo‐électronique, que l'énergie d'ionisation du niveau 1sdu silicium s'augmente avec l'électro‐ negativité de l'autre élément,Xdans la liaison Si‐X. L'énergie d'ionisation des liaisons s̀, pour Si‐X, augmente aussi pourX= Si → O → F. Donc l'énergie de l'émission Kβ reste presque la même avec la variation deX. Mais si on peut changer l'ionicité de la liaison (avec le même ligand) on aurait, augmentation de l'énergie d'ionisation du silicium 1set diminution de l'énergie de la liaison s̀. C'est pourquoi l'énergie de la rayon‐X, Kβ est 1840 e V pour Si(CH3·CO·CH·COCH3)3+HCL2−(coordination du Si, 6) mais seulement ˜ 183

ISSN:0049-8246    

DOI:10.1002/xrs.1300020103

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

ISSN:0049-8246    

DOI:10.1002/xrs.1300020111

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

ISSN:0049-8246    

DOI:10.1002/xrs.1300020113

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

摘要:

AbstractThe K soft X‐ray emission profile of nitrogen in the vanadium nitride VN has been investigated with an electron microprobe. It is shown that this instrument is capable of sufficiently resolving the N K band to provide information about the filled states of the valence band. Moreover, with this same compound, the first K absorption spectrum of nitrogen has been obtained by a self absorption method. VN is only an experimental example. To find the complete picture of the electronic band structure of solid materials, similar emission and absorption spectra of nitrogen in some other interesting compounds can now be surveyed with the electron microprob

ISSN:0049-8246    

DOI:10.1002/xrs.1300020104

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

摘要:

AbstractThe combination of energy dispersive X‐ray analysis with the transmission electron microscope enables the microscopist to rapidly identify features observed in the normal operation of the microscope, at high magnification. The development of equipment and techniques, especially in the art of specimen preparation, will now permit analysis of as little as 10‐18g, on a spatial scale of a few tens of nanometres. The importance of this technique in the biological and materials sciences promises to be as great as the contribution of the electron microscope its

ISSN:0049-8246    

DOI:10.1002/xrs.1300020105

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

摘要:

AbstractDirect dilution of a sample with an equal proportion of cellulose binder and dilution fusion of one part of sample with fourteen parts of LiBO2flux has been used to prepare pelletized samples of silicate standards for determining sodium by X‐ray fluorescence analysis. An RAP analysing crystal was used to disperse and reflect the sodium spectra. Detection limits were found to be 0.07 and 0.39% Na2O at the 2s̀ confidence level for the direct dilution and dilution fusion preparation techniques, respective

ISSN:0049-8246    

DOI:10.1002/xrs.1300020106

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

摘要:

AbstractThe analogies between XRFA and XPS are the basis for the development of quantitative XPS methods for solid metallic samples and also for the determination of inelastic scattering coefficients. The results of the theoretical treatment have been verified by experiments.

ISSN:0049-8246    

DOI:10.1002/xrs.1300020107

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

摘要:

AbstractIsotope excited energy‐dispersive X‐ray fluorescence determination of silver in photographic materials yields poor reproducibility because of difficulties in reproducing the geometry. By placing the film sample between the detector and the radioactive source this difficulty is overcome. The theory of such an arrangement indicates that effects due to varying thickness of film base or unequal coating in the case of double‐coated film play a minor role. The suggested improvements in measuring geometry should be of value for any application in which samples are in the form of thin foils or s

ISSN:0049-8246    

DOI:10.1002/xrs.1300020108

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY

摘要:

AbstractThis account describes a rapid and accurate fusion technique of X‐ray fluorescence analysis that is based on the method of Norrish and Hutton,1but modified from the latter in a number of respects to enable more rapid preparation and processing of samples without any loss of accuracy. The technique allows a wide range of materials to be analysed including silicate rocks and minerals, cements, bricks, carbonates, evaporites, soils and some ore

ISSN:0049-8246    

DOI:10.1002/xrs.1300020109

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1973

数据来源: WILEY