X‐Ray Spectrometry


ISSN: 0049-8246        年代:1982
当前卷期:Volume 11  issue 1     [ 查看所有卷期 ]

年代:1982
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  1-1

Ron Jenkins,  

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2. A simple method for calculating x‐ray absorption spectra for use in crystal spectrometer and mirror analysis
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  2-7

A. Shah,   S. J. Gurman,  

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3. Simultaneous multielement analysis of phosphates by x‐ray fluorescence
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  8-12

D. Issahary,   I. Pelly,  

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4. Energy dispersive x‐ray diffractometry: 1. The specimen transparency factor
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  13-18

M. Mantler,  

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5. Energy dispersive x‐ray diffractometry: 2. Phase transformations at elevated temperatures
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  19-24

M. Mantler,  

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6. An improved method of x‐ray fluorescence analysis of chrome containing refractories
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  25-28

Subrata Banerjee,   Ben G. Olsen,   Melvin K. Hess,  

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7. Rapid preparation of robust pressed powder briquettes containing a styrene and wax mixture as binder
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  29-31

C. van Zyl,  

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8. Quantitative determination of argon in sputtered films by wavelength‐dispersive electron probe microanalysis
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  32-34

P. Willich,   D. Obertop,  

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9. Co Kα X‐ray shift in Co3O4
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  35-35

P. Gielen,  

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10. Calibration standards. The XRF standards of the iron and Steel Institute of Japan
  X‐Ray Spectrometry,   Volume  11,   Issue  1,   1982,   Page  36-39

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