X‐Ray Spectrometry


ISSN: 0049-8246        年代:1984
当前卷期:Volume 13  issue 1     [ 查看所有卷期 ]

年代:1984
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  1-1

Ron Jenkins,  

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2. Energy‐dispersive x‐ray fluorescence analysis of silicate rocks for major and trace elements
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  2-15

P. J. Potts,   P. C. Webb,   J. S. Watson,  

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3. Some possibilities for the use of so‐called ‘differential’ correction equations in x‐ray fluorescence analysis
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  16-22

Andrzej Kuczumow,  

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4. Consideration of an enhancement effect simplified expression in limiting cases in x‐ray fluorescence analysis
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  23-26

Andrzej Kuczumow,  

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5. Heterogeneity effects in direct x‐ray fluorescence analysis of hair
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  27-32

Sz. Török,   P. Van Dyck,   R. Van Grieken,  

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6. Limitations in the use of the peak‐to‐background method for quantitative analysis
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  33-37

Peter Rez,   John Konopka,  

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7. Proton and photon‐induced x‐ray fluorescence intensity from a monolayer sample of complex chemical and granular composition
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  38-43

V. F. Volkov,   N. N. Krasnopolskaya,  

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8. Measuring the dead time of an x‐ray spectrometer by means of the first‐ and second‐order reflections method
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  44-45

R. D. Bonetto,   J. A. Riveros,  

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9. Reflective properties of beryl and gypsum crystals in the 1 keV photon energy region
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  46-48

E. Belin,   S. Zuckerman,   C. Sénémaud,  

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10. Normalization in x‐ray microanalysis
  X‐Ray Spectrometry,   Volume  13,   Issue  1,   1984,   Page  49-49

Stróz Kazimierz,  

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