X‐Ray Spectrometry


ISSN: 0049-8246        年代:1979
当前卷期:Volume 8  issue 1     [ 查看所有卷期 ]

年代:1979
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  1-1

Ron Jenkins,  

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2. A fast and simple procedure for the evaluation of net intensities from energy‐dispersive X‐ray spectra
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  2-6

S. Ekelund,   A. Thurén,   T. Werlefors,  

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3. A comparison of the transmission properties of 1 μm and 6 μm polypropylene flow counter windows
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  7-8

A. Seaman,  

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4. Loss of sulphur during irradiation of X‐ray spectrometric standards prepared using cellulose and poly(vinyl alcohol)
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  9-10

R. T. King,  

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5. An X‐ray fluorescence method for coating thickness measurement
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  11-13

S. K. Jain,   P. P. Gupta,   A. C. Eapen,  

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6. A method of correction for absorption matrix effects in samples of ‘intermediate’ thickness in EDXRF analysis
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  14-18

Andrzej Markowicz,  

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7. The Bragg reflection integral for pentaerythritol
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  19-26

Ray Hall,   Margaret Lewis,   Bryan Leigh,   Kenton Evans,  

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8. Quantitative energy‐dispersive X‐ray analysis of transition elements in aluminium alloys, at concentrations of less than 1%
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  27-29

R. Mora,  

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9. Instrumental interferences in X‐ray fluorescence analysis of thin samples
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  30-32

Norman A. Bonner,  

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10. A non‐linear least squares fitting routine for optimizing empirical XRF matrix correction models
  X‐Ray Spectrometry,   Volume  8,   Issue  1,   1979,   Page  33-41

W. N. Schreiner,   R. Jenkins,  

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