首页   按字顺浏览 期刊浏览 卷期浏览 The revealing of information concealed in overexposed x‐ray topographs
The revealing of information concealed in overexposed x‐ray topographs

 

作者: S. Mardix,  

 

期刊: Applied Physics Letters  (AIP Available online 1973)
卷期: Volume 22, issue 5  

页码: 214-215

 

ISSN:0003-6951

 

年代: 1973

 

DOI:10.1063/1.1654614

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Thick photographic emulsions are used with weakly absorbed radiations. These emulsions are capable of photographic densities much higher than 1.5. High‐density areas appear black, and photographic details are lost when viewed with transmitted light. Reflected‐light techniques can reveal those details. Application to x‐ray topography is demonstrated.

 

点击下载:  PDF (165KB)



返 回