Characterization with XPS of a Thin Film of B2O2Deposited on a Ag Substrate
作者:
Yajun Wang,
Michael Trenary,
期刊:
Surface Science Spectra
(AIP Available online 1992)
卷期:
Volume 1,
issue 2
页码: 183-187
ISSN:1055-5269
年代: 1992
DOI:10.1116/1.1247690
出版商: American Vacuum Society
关键词: BORON OXIDES;PHOTOELECTRON SPECTROSCOPY;X RADIATION;MASS SPECTRA;THIN FILMS;KNUDSEN FLOW;BINDING ENERGY
数据来源: AIP
摘要:
XPS spectra are presented for a thin film of a suboxide of boron formed by condensing B2O2(g) on a clean Ag foil substrate. Spectroscopic characterization of boron suboxides are important as these compounds may exist as surface intermediates in the oxidation of solid boron and of boron compounds. The B2O2(g) source consists of a Knudsen cell in which B(s) and B2O3(s) are heated to 1123 K. Mass spectroscopic analysis confirms that only B2O2(g) effuses from the source. The condensed B2O2film has a B 1sbinding energy of 192.55 eV which allows this boron suboxide to be distinguished from the principal boron oxide B2O3, which has a binding energy of 193.5-194.0 eV [W. C. Foo, J. S. Ozcomert, and M. Trenary, Surf. Sci.255, 245 (1991)].
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