Ambipolar diffusion measurements in semiconductors using nonlinear transient gratings
作者:
K. Jarasˆiu¯nas,
H. J. Gerritsen,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 33,
issue 2
页码: 190-193
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.90270
出版商: AIP
数据来源: AIP
摘要:
The theory of self‐diffraction of light by transient free‐carrier gratings in semiconductors has been expanded to the case in which nonlinear absorption of light creates the grating. Its application to the experiments performed allowed determination of the free‐carrier ambipolar diffusion coefficients in CdS, CdSe, and ZnSe crystals, and the mechanism of free‐carrier recombination and carrier lifetime in CdS at low temperatures.
点击下载:
PDF
(324KB)
返 回