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Ambipolar diffusion measurements in semiconductors using nonlinear transient gratings

 

作者: K. Jarasˆiu¯nas,   H. J. Gerritsen,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 33, issue 2  

页码: 190-193

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.90270

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The theory of self‐diffraction of light by transient free‐carrier gratings in semiconductors has been expanded to the case in which nonlinear absorption of light creates the grating. Its application to the experiments performed allowed determination of the free‐carrier ambipolar diffusion coefficients in CdS, CdSe, and ZnSe crystals, and the mechanism of free‐carrier recombination and carrier lifetime in CdS at low temperatures.

 

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