On‐line gas electron diffraction identification of gas chromatography effluents (GC‐GED)
作者:
John D. Ewbank,
David W. Paul,
Lothar Scha¨fer,
Khamis Siam,
David L. Monts,
Walter L. Faust,
期刊:
Review of Scientific Instruments
(AIP Available online 1988)
卷期:
Volume 59,
issue 7
页码: 1144-1147
ISSN:0034-6748
年代: 1988
DOI:10.1063/1.1139741
出版商: AIP
数据来源: AIP
摘要:
Experiments are described which document the utility of gas electron diffraction (GED) as a means of detecting analytes emerging from the column of a gas chromatograph (GC). In these experiments electron diffraction patterns from GC effluents are made visible on a phosphor screen, and the intensities of each GC peak are recorded on line by a 1024‐channel linear photodiode array detector. The technique not only indicates the presence of elutants but also provides auxiliary information on their molecular structures under favorable conditions. Minimum sample sizes of about 1 &mgr;l per component are currently required for GC‐GED, but indications are that further detector enhancements will allow the recording of electron intensities from smaller samples.
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