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A new scanning microdiffraction technique

 

作者: K. J. van Oostrum,   A. Leenhouts,   A. Jore,  

 

期刊: Applied Physics Letters  (AIP Available online 1973)
卷期: Volume 23, issue 5  

页码: 283-284

 

ISSN:0003-6951

 

年代: 1973

 

DOI:10.1063/1.1654890

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It is shown that scanning display of diffraction patterns is possible with a fixed electron detector placed at the appropriate position in the final image in an electron microscope, if the direction of illumination is varied by means of deflection coils in the wobbler unit. The diameter of the specimen area selected for diffraction study can be as small as 100 Å, depending on detector dimensions and microscope magnification. This technique for microdiffraction has been demonstrated with samples of small gold particles evaporated on a collodion substrate.

 

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