A new scanning microdiffraction technique
作者:
K. J. van Oostrum,
A. Leenhouts,
A. Jore,
期刊:
Applied Physics Letters
(AIP Available online 1973)
卷期:
Volume 23,
issue 5
页码: 283-284
ISSN:0003-6951
年代: 1973
DOI:10.1063/1.1654890
出版商: AIP
数据来源: AIP
摘要:
It is shown that scanning display of diffraction patterns is possible with a fixed electron detector placed at the appropriate position in the final image in an electron microscope, if the direction of illumination is varied by means of deflection coils in the wobbler unit. The diameter of the specimen area selected for diffraction study can be as small as 100 Å, depending on detector dimensions and microscope magnification. This technique for microdiffraction has been demonstrated with samples of small gold particles evaporated on a collodion substrate.
点击下载:
PDF
(218KB)
返 回