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A comparison of surface analysis using ion scattering, ion‐produced photons, and secondary ion emission

 

作者: R. J. MacDonald,   W. Heiland,   E. Taglauer,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 33, issue 7  

页码: 576-578

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.90465

 

出版商: AIP

 

数据来源: AIP

 

摘要:

ISS, SIMS (recoil target ions), and ion‐produced photon emission (IPP) from surfaces subject to low‐energy ion bombardment have been compared by simultaneous measurement of the effect of reactive gas adsorption on each signal. A direct correlation between the three signal strengths has been established. Cross sections for desorption of CO from Ni due to low‐energy ion bombardment have been measured independently and simultaneously by two of the three methods.

 

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