A comparison of surface analysis using ion scattering, ion‐produced photons, and secondary ion emission
作者:
R. J. MacDonald,
W. Heiland,
E. Taglauer,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 33,
issue 7
页码: 576-578
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.90465
出版商: AIP
数据来源: AIP
摘要:
ISS, SIMS (recoil target ions), and ion‐produced photon emission (IPP) from surfaces subject to low‐energy ion bombardment have been compared by simultaneous measurement of the effect of reactive gas adsorption on each signal. A direct correlation between the three signal strengths has been established. Cross sections for desorption of CO from Ni due to low‐energy ion bombardment have been measured independently and simultaneously by two of the three methods.
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