A new class of electron interferometers is proposed that make use of a laser‐modulated electron beam. The observable interference arises in second‐order processes, since the first‐order interference oscillates rapidly and averages to zero. It is shown that the detected signal varies sinusoidally with the separation of two sequential modulators, thus generating a fringe pattern with peak‐to‐peak spacing that may be smaller or larger than the laser wavelength. It is suggested that such devices could be used to detect and study the modulation process and, because they operate with massive charged particles, to perform a wide variety of new experiments and high‐precision measurements.