X-ray photoelectron spectroscopy was used to examine a film of silicone evaporated onto a 13 mm diameter glass substrate. The material was dissolved into toluene, deposited onto the glass substrate, then the toluene was allowed to evaporate. Data were collected, stored and processed with a Hewlett-Packard model 5950B ESCA. Measured atomic percentages very closely matched the expected stoichiometry at three different electron take off angles, indicating homogeneity.