Exhaustive testing of stuck-open faults in CMOS combinational circuits
作者:
J.A.Bate,
D.M.Miller,
期刊:
IEE Proceedings E (Computers and Digital Techniques)
(IET Available online 1988)
卷期:
Volume 135,
issue 1
页码: 10-16
年代: 1988
DOI:10.1049/ip-e.1988.0002
出版商: IEE
数据来源: IET
摘要:
CMOS circuits present some unique testing problems. Certain physical failures are not adequately represented by the traditional stuck-at fault model. Opens in transistors or their connections, a ‘stuck-open’ fault, can require a sequence of tests. A number of test schemes employing exhaustive or pseudo-exhaustive input sequences have appeared in the literature. Here we examine the applicability of such a method to the testing of stuck-open faults in CMOS combinational circuits. It is shown that without careful planning an exhaustive test may not detect all stuck-open faults. A universal input sequence which will detect all stuck-open faults is proposed. This sequence corresponds to a Eulerian cycle in a directed hypercube. A circuit which generates such a sequence is outlined.
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