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Exhaustive testing of stuck-open faults in CMOS combinational circuits

 

作者: J.A.Bate,   D.M.Miller,  

 

期刊: IEE Proceedings E (Computers and Digital Techniques)  (IET Available online 1988)
卷期: Volume 135, issue 1  

页码: 10-16

 

年代: 1988

 

DOI:10.1049/ip-e.1988.0002

 

出版商: IEE

 

数据来源: IET

 

摘要:

CMOS circuits present some unique testing problems. Certain physical failures are not adequately represented by the traditional stuck-at fault model. Opens in transistors or their connections, a ‘stuck-open’ fault, can require a sequence of tests. A number of test schemes employing exhaustive or pseudo-exhaustive input sequences have appeared in the literature. Here we examine the applicability of such a method to the testing of stuck-open faults in CMOS combinational circuits. It is shown that without careful planning an exhaustive test may not detect all stuck-open faults. A universal input sequence which will detect all stuck-open faults is proposed. This sequence corresponds to a Eulerian cycle in a directed hypercube. A circuit which generates such a sequence is outlined.

 

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