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Laser‐induced damage in transparent dielectrics: ion beam polishing as a means of increasing surface damage thresholds

 

作者: Concetto R. Giuliano,  

 

期刊: Applied Physics Letters  （AIP Available online 1972）
卷期: Volume 21, issue 1  

页码: 39-41

 

ISSN:0003-6951

 

年代: 1972

 

DOI:10.1063/1.1654211

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Polishing of sapphire surfaces with energetic Ar+ion beams is shown to result in a substantial increase in laser damage threshold over that for conventionally polished surfaces. Data for both entrance and exit damage are presented. The results are interpreted in terms of an increase in surface strength with ion beam polishing.

 

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