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Spatial resolution of thermal wave microscopes

 

作者: L. J. Inglehart,   K. R. Grice,   L. D. Favro,   P. K. Kuo,   R. L. Thomas,  

 

期刊: Applied Physics Letters  （AIP Available online 1983）
卷期: Volume 43, issue 5  

页码: 446-448

 

ISSN:0003-6951

 

年代: 1983

 

DOI:10.1063/1.94383

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It is demonstrated theoretically and confirmed experimentally that the intrinsic spatial resolution of a thermal wave microscope in the extreme near field limit is independent of thermal wavelength and is determined by the depth of the thermal scatterer beneath the surface of the specimen.

 

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