X‐ray photoelectron spectroscopic study of the oxide removal mechanism of GaAs (100) molecular beam epitaxial substrates ininsituheating
作者:
R. P. Vasquez,
B. F. Lewis,
F. J. Grunthaner,
期刊:
Applied Physics Letters
(AIP Available online 1983)
卷期:
Volume 42,
issue 3
页码: 293-295
ISSN:0003-6951
年代: 1983
DOI:10.1063/1.93884
出版商: AIP
数据来源: AIP
摘要:
A standard cleaning procedure for GaAs (100) molecular beam epitaxial (MBE) substrates is a chemical treatment with a solution of H2SO4/H2O2/H2O, followed byinsituheating prior to MBE growth. X‐ray photoelectron spectroscopic (XPS) studies of the surface following the chemical treatment show that the oxidized As is primarily As+5. Upon heating to low temperatures (<350 °C) the As+5oxidizes the substrate to form Ga2O3and elemental As (As0), and the As+5is reduced to As+3in the process. At higher temperatures (500 °C), the As+3and As0desorb, while the Ga+3begins desorbing at ∼600 °C.
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