The use of x-ray fluorescence spectroscopy (XFS) using hard x-rays (λ <2 A), or soft (S) x-rays (2 A<λ<10 A) for elemental analysis of thin films and coatings, where the film thickness (t) is about 103A or greater, is textbook information.(1)A cursory examination of the literature reveals no information of thin film characterization (elemental or molecular) in the ultrasoft (US) region (λ>10 A). This finding is particularly surprising since, as discussed below, one could expect USXFS to be able to characterize surface-thin films with t values below 103A.