Broadening of Fast‐Beam Spectral Lines Due to Diffraction at the Entrance Slit of a Spectrometer
作者:
John A. Leavitt,
John O. Stoner,
期刊:
Applied Physics Letters
(AIP Available online 1972)
卷期:
Volume 20,
issue 10
页码: 379-380
ISSN:0003-6951
年代: 1972
DOI:10.1063/1.1653983
出版商: AIP
数据来源: AIP
摘要:
We show experimentally and theoretically that adjustment of a spectrometer for observation of fast‐beam spectral lines under conditions of minimum linewidth requires consideration of the effects of diffraction at the spectrometer's entrance slit. We obtain an approximate expression for the optimum entrance slit width to be used in order to avoid the pronounced broadening of the spectral lines that occurs for very narrow entrance slits.
点击下载:
PDF
(168KB)
返 回