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Broadening of Fast‐Beam Spectral Lines Due to Diffraction at the Entrance Slit of a Spectrometer

 

作者: John A. Leavitt,   John O. Stoner,  

 

期刊: Applied Physics Letters  (AIP Available online 1972)
卷期: Volume 20, issue 10  

页码: 379-380

 

ISSN:0003-6951

 

年代: 1972

 

DOI:10.1063/1.1653983

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We show experimentally and theoretically that adjustment of a spectrometer for observation of fast‐beam spectral lines under conditions of minimum linewidth requires consideration of the effects of diffraction at the spectrometer's entrance slit. We obtain an approximate expression for the optimum entrance slit width to be used in order to avoid the pronounced broadening of the spectral lines that occurs for very narrow entrance slits.

 

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