首页   按字顺浏览 期刊浏览 卷期浏览 Thickness measurement in liquid film flow by laser scattering
Thickness measurement in liquid film flow by laser scattering

 

作者: Ronald P. Salazar,   Ekkehard Marschall,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1975）
卷期: Volume 46, issue 11  

页码: 1539-1541

 

ISSN:0034-6748

 

年代: 1975

 

DOI:10.1063/1.1134099

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A method is described for measuring the thickness of a flowing liquid film by the use of laser scattering from suspended latex particles. The apparatus described has a linear voltage to film thickness relationship, unlike capacitance and resistance methods.

 

点击下载:  PDF (180KB)



返 回