作者: Richard S. Crandall,
期刊: Applied Physics Letters (AIP Available online 1983) 卷期: Volume 42, issue 5
页码: 451-453
ISSN:0003-6951
年代: 1983
DOI:10.1063/1.93967
出版商: AIP
数据来源: AIP
摘要:
Measurements of the capacitance due to photogenerated electrons and holes that are displaced by the electric field are described. A model calculation shows that the photocapacitance is a measure of the drift mobility of the carriers.
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