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Direct measurement of the carrier leakage in an InGaAsP/InP laser

 

作者: T. R. Chen,   S. Margalit,   U. Koren,   K. L. Yu,   L. C. Chiu,   A. Hasson,   A. Yariv,  

 

期刊: Applied Physics Letters  （AIP Available online 1983）
卷期: Volume 42, issue 12  

页码: 1000-1002

 

ISSN:0003-6951

 

年代: 1983

 

DOI:10.1063/1.93841

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Carrier leakage over the heterobarrier in an InGaAsP/InP laser is measured directly in a laser‐bipolar‐transistor structure. Experimental results indicate a significant amount of carrier leakage under normal laser operating conditions.

 

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