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Recombination of highly charged ions with free electrons

 

作者: A. Mu¨ller,   A. Frank,   J. Haselbauer,   G. Hofmann,   J. Neumann,   U. Pracht,   E. Salzborn,   S. Schennach,   W. Spies,   M. Stenke,   O. Uwira,   R. Vo¨lpel,   M. Wagner,   R. Becker,   E. Jennewein,   M. Kleinod,   U. Pro¨bstel,   R. A. Phaneuf,   G. H. Dunn,   E. M. Bernstein,   N. Angert,   P. H. Mokler,  

 

期刊: AIP Conference Proceedings  （AIP Available online 1992）
卷期: Volume 257, issue 1  

页码: 15-25

 

ISSN:0094-243X

 

年代: 1992

 

DOI:10.1063/1.42470

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Recombination of highly charged ions and free electrons is studied in interacting‐beam experiments. Beside direct recombination into bound states by radiative capture a variety of resonant recombination phenomena is observed. Resonant recombination produces a highly excited, usually short lived electron‐ion compound which can stabilize by the emission of photons and/or electrons. Depending on this emission, the final charge state of the ion can be one less than the parent charge state, but it can also be higher and thus a net single or multiple ionization of the ion is observed after the initial recombination.

 

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