Fundamental electron and ion beam interactions with solids for microscopy, microanalysis and microlithography. Scanning microscopy supplement 4, edited by Jergen Schou, Pieter Kruit, and Dale Newbury. Scanning Microscopy International, AMF O'Hare, Chicago, Illinois, 1990, 379 pp, $59.00 (USA), $64.00 (elsewhere)

 

作者: P. E. Batson,  

 

期刊: Microscopy Research and Technique  （WILEY Available online 1992）
卷期: Volume 20, issue 1  

页码: 102-102

 

ISSN:1059-910X

 

年代: 1992

 

DOI:10.1002/jemt.1070200111

 

出版商: Wiley Subscription Services, Inc., A Wiley Company

 

数据来源: WILEY

 

 

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