Nickel(100) by XPS

 

作者: Steven J. Schmieg,   David N. Belton,  

 

期刊: Surface Science Spectra  (AIP Available online 1992)
卷期: Volume 1, issue 4  

页码: 337-340

 

ISSN:1055-5269

 

年代: 1992

 

DOI:10.1116/1.1247663

 

出版商: American Vacuum Society

 

关键词: NICKEL;PHOTOELECTRON SPECTROSCOPY;X RADIATION;LEED;MONOCRYSTALS;SURFACE CLEANING;ARGON IONS;BINDING ENERGY;SPUTTERING;ANNEALING

 

数据来源: AIP

 

摘要:

X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED) were used to characterize a clean and highly-oriented Ni(100) single crystal. The Ni(100) crystal was cleaned and ordered with a combination of Ar-ion bombardment and annealing. There were no contaminants observed in XPS. The XPS binding energies were referenced to the Fermi edge of the clean nickel crystal.

 

点击下载:  PDF (238KB)



返 回