Nickel(100) by XPS
作者:
Steven J. Schmieg,
David N. Belton,
期刊:
Surface Science Spectra
(AIP Available online 1992)
卷期:
Volume 1,
issue 4
页码: 337-340
ISSN:1055-5269
年代: 1992
DOI:10.1116/1.1247663
出版商: American Vacuum Society
关键词: NICKEL;PHOTOELECTRON SPECTROSCOPY;X RADIATION;LEED;MONOCRYSTALS;SURFACE CLEANING;ARGON IONS;BINDING ENERGY;SPUTTERING;ANNEALING
数据来源: AIP
摘要:
X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED) were used to characterize a clean and highly-oriented Ni(100) single crystal. The Ni(100) crystal was cleaned and ordered with a combination of Ar-ion bombardment and annealing. There were no contaminants observed in XPS. The XPS binding energies were referenced to the Fermi edge of the clean nickel crystal.
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