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Angular scanning stage for glancing‐incidence surface EXAFS

 

作者: D. T. Jiang,   N. Alberding,   A. J. Seary,   E. D. Crozier,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1988）
卷期: Volume 59, issue 1  

页码: 60-63

 

ISSN:0034-6748

 

年代: 1988

 

DOI:10.1063/1.1139966

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In this paper a simple and inexpensive angular positioning apparatus is described which can be applied to measurements of x‐ray reflectivity and extended x‐ray absorption fine structure (EXAFS) at glancing angles of incidence. An efficient interactive alignment procedure is discussed and the performance of the device is given.

 

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