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X‐ray response of AlGaAs/GaAs radiation‐hardened double‐heterostructure photodiode compared to Si:p‐i‐nphotodiodes

 

作者: J. P. Anthes,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1988)
卷期: Volume 59, issue 8  

页码: 1846-1848

 

ISSN:0034-6748

 

年代: 1988

 

DOI:10.1063/1.1140078

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Requirements for continuous operation of photodiodes in the presence of nuclear radiation has led to the development of a novel AlGaAs/GaAs photodiode. Device structure and semiconductor properties of this design were optimized to balance the need for photodetection at &lgr;=820 nm against unwanted excess photocurrents induced by ionizing radiation. To achieve radiation hardness the photodiode employs a double‐heterojunction device structure. The spectral response of this detector, 1 keV–10 MeV, may offer unique opportunities for use in high‐temperature plasma diagnostics compared to typical bare Si:p‐i‐nx‐ray photodiode characteristics. Application of this AlGaAs/GaAs detector in a fiber‐optic link will be reviewed. Also, use of this detector in simple atomic‐absorption‐edge filtered x‐ray detector channels is presented.

 

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