首页   按字顺浏览 期刊浏览 卷期浏览 Bunch shape monitors using low energy secondary electron emission
Bunch shape monitors using low energy secondary electron emission

 

作者: A. V. Feschenko,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1992)
卷期: Volume 281, issue 1  

页码: 185-193

 

ISSN:0094-243X

 

年代: 1992

 

DOI:10.1063/1.44336

 

出版商: AIP

 

数据来源: AIP

 

摘要:

To measure a longitudinal charge distribution in an ion linac beam it is preferable to apply bunch shape monitors using a low energy secondary emission electrons. Monitors of this type and their development are discussed. Different varieties of rf deflectors for a transverse modulation of secondary electrons are considered. Preliminary parameters of a bunch shape monitor for the SSC linac are presented. A detector to measure both longitudinal and transverse distributions of a two component ion beam is described.

 

点击下载:  PDF (571KB)



返 回