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Measurements of kinetic processes in a self‐sustained discharge XeF laser

 

作者: M. C. Gower,   R. Exberger,   P. D. Rowley,   K. W. Billman,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 33, issue 1  

页码: 65-67

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.90146

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The XeF* and F* sidelight emissions, the small‐signal gain, and the transient plasma absorption near the laser wavelength have been measured from a XeF self‐sustained discharge laser. We conclude that the production of XeF* in its lower vibrational levels requires collisions with He atoms, and that XeF* decays predominantly by radiative processes and He quenching. The transient absorption at the laser wavelength, believed to be due to F−, F*, F*2, and Xe+2, can be as large as ∼1–2%/cm at small‐signal gains of ∼8%/cm.

 

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