Measurements of kinetic processes in a self‐sustained discharge XeF laser
作者:
M. C. Gower,
R. Exberger,
P. D. Rowley,
K. W. Billman,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 33,
issue 1
页码: 65-67
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.90146
出版商: AIP
数据来源: AIP
摘要:
The XeF* and F* sidelight emissions, the small‐signal gain, and the transient plasma absorption near the laser wavelength have been measured from a XeF self‐sustained discharge laser. We conclude that the production of XeF* in its lower vibrational levels requires collisions with He atoms, and that XeF* decays predominantly by radiative processes and He quenching. The transient absorption at the laser wavelength, believed to be due to F−, F*, F*2, and Xe+2, can be as large as ∼1–2%/cm at small‐signal gains of ∼8%/cm.
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