Instrumental developments in total reflection x‐ray fluorescence analysis for K‐lines from oxygen to the rare earth elements
作者:
P. Wobrauschek,
P. Kregsamer,
C. Streli,
H. Aiginger,
期刊:
X‐Ray Spectrometry
(WILEY Available online 1991)
卷期:
Volume 20,
issue 1
页码: 23-28
ISSN:0049-8246
年代: 1991
DOI:10.1002/xrs.1300200106
出版商: Wiley Subscription Services, Inc., A Wiley Company
数据来源: WILEY
摘要:
AbstractDevelopments in the instrumentation of total reflection x‐ray fluorescence analysis (TXRF) are presented. Different ways of obtaining optimized primary radiation are discussed, and a new double reflector‐collimator is introduced. To increase the number of detectable elements, special devices for low‐Zand high‐Zdeterminations are presented, in addition to a modular TXRF attachment for versatile applications. Detection limits achieved by various types of excitation conditions are given. TXRF has been shown to be a powerful analytical tool for trace element determinations in various
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