Inequality of semiconductor heterojunction conduction‐band‐edge discontinuity and electron affinity difference
作者:
Robert S. Bauer,
Peter Zurcher,
Henry W. Sang,
期刊:
Applied Physics Letters
(AIP Available online 1983)
卷期:
Volume 43,
issue 7
页码: 663-665
ISSN:0003-6951
年代: 1983
DOI:10.1063/1.94438
出版商: AIP
数据来源: AIP
摘要:
The commonly used Anderson electron affinity rule is shownnotto provide the band‐edge offsets at the interface between different semiconductors. Using synchrotron radiation excited photoelectron spectroscopy, we determine electron affinities &khgr; of 4.14+0.17−0.09 eV for a Ge(110) surface and of 4.15+0.17−0.09 eV for a 18‐A˚ GaAs(110) epitaxial overlayer on Ge(110). In the same experiment, for the same layers, a conduction‐band discontinuity &Dgr;Ecof 0.54±0.08 eV is measured for the heterojunction of GaAs grown by molecular beam epitaxy on Ge(110). Compilation of data on 14 recent photoemission studies confirms that &Dgr;Ec≠&Dgr; &khgr; for most heterojunction systems investigated to date.
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